The existing equipment of CNT laboratories was supplemented by a new machine FlexSEM 1000II from Hitachi

The FlexSEM 1000 II VP-SEM is an ideal flexible instrument not only because of its "size" and the possibility to be placed even in smaller laboratory spaces, but above all because of its imaging functions, even in variable pressure environments, which is its great advantage.
Such functionality was previously only available for full-size SEMs.

The microscope is equipped with an EDS elemental composition analyzer (Bruker) and in combination with microstructure imaging allows the analysis of materials for a wide range of applications. A significant functional advantage of the microscope is that biological, biomineralised and non-conductive samples can generally be observed without pre-treatment by plating over the entire pressure and accelerating voltage range and still with very good image sharpness.
At an accelerating voltage of 20 keV in the secondary electron mode, the standard resolution is 4 nm at 60,000x magnification.

The FlexSEM uses the Opti-Bias system to provide higher radiant current at low kV for optimum brightness. The result is the best image sharpness in the class of benchtop electron microscopes at low accelerating voltage.

At the CNT workplace we are now making intensive use of the JEOL JSM-7610F Plus scanning transmission electron microscope with EDS microanalyzer (Oxford Instruments) and the NenoVision LiteScope "in-situ" correlation AFM unit. In addition, the microscope with Schottky FEG cathode, which allows to observe nanoparticles also in transmission mode at 30 keV with standard resolution of 0.6 nm.
And now the equipment has been expanded to include the FlexSEM 1000II VP-SEM.